منابع مشابه
In situ thin-film texture determination
A kinematic theory of reflection high energy electron diffraction ~RHEED! is presented for textured polycrystalline thin films. RHEED patterns are calculated for arbitrary texture situations and for any general crystallographic orientation that may be encountered in thin-film growth. It is shown that the RHEED pattern can be used as a fast and convenient tool for in situ texture characterizatio...
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It has been demonstrated that rapid thermal sulphurisation of sputtered Cu/In precursor layers is suitable for industrial production of thin-film photovoltaic modules. The process is relatively straightforward and the underlying fundamental aspects, such as phase formation sequence and reaction rates, have been studied intensively. Using lab-scale preparation technology, incorporation of galliu...
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We describe a new type of magnetometer based on a microelectromechanical system (MEMS) for in situ monitoring of magnetic film moment during the film deposition process. The magnetometer measures mechanical torque on a film as it is deposited onto a microscopic flexible silicon cantilever. The cantilever is excited by an external ac magnetic field and its angular displacement is proportional to...
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Touch (or tactile) sensors are gaining renewed interest as the level of sophistication in the application of minimum invasive surgery and humanoid robots increases. The spatial resolution of current large-area (greater than 1 cm(2)) tactile sensor lags by more than an order of magnitude compared with the human finger. By using metal and semiconducting nanoparticles, a approximately 100-nm-thick...
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High-resolution transmission electron microscopy (HR-TEM) has been used as the ultimate method of thickness measurement for thin films. The appearance of phase contrast interference patterns in HR-TEM images has long been confused as the appearance of a crystal lattice by nonspecialists. Relatively easy to interpret crystal lattice images are now directly observed with the introduction of annul...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 1999
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.369519